BTLM 2/3" Bi-Telecentric Lens Series | High Precision Machine Vision Measurement Lens

ContrastechSTK:BTLM-0.5X-65-23
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Specification: WD:65mm Mag.0.5x
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İndirimli fiyat$725.00

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Product Description

High-Precision 2/3" Bi-Telecentric Lenses for Industrial Measurement and Machine Vision

The BTLM 2/3" Series bi-telecentric lenses are engineered for high-accuracy machine vision and metrology applications, offering ultra-stable imaging performance with zero perspective error across the entire field of view.

Designed specifically for 2/3" industrial area scan cameras (Φ11mm sensor support), this series provides multiple magnification options from 0.166X to 0.5X, making it ideal for both wide-field inspection and precision measurement tasks.

With ultra-low distortion (<0.1% / <0.03% depending on model), high telecentricity (<0.1°), and MTF performance exceeding 160–260 lp/mm, the BTLM series ensures extremely sharp and repeatable imaging results in demanding industrial environments.

Optional coaxial illumination versions (D models) are available for reflective surfaces, while manual iris options enable flexible depth-of-field control in complex inspection conditions.

Key Features

✔ Optimized for 2/3" Sensors (Φ11mm Image Circle)
Perfect match for high-resolution industrial area scan cameras.

✔ Wide Magnification Range (0.166X–0.5X)
Flexible configuration for different inspection fields of view.

✔ Ultra-High Optical Resolution (MTF >160–260 lp/mm)
Ensures sharp detail capture for precision metrology.

✔ Ultra-Low Distortion (<0.03%–<0.1%)
Provides highly accurate geometric measurement.

✔ Zero Perspective Error Design
Ensures stable and repeatable measurement accuracy.

✔ Optional Coaxial Illumination Versions (D Models)
Ideal for reflective or low-contrast surfaces.

✔ Long Working Distance Design (65–173mm)
Flexible integration into industrial inspection systems.

✔ Optional Manual Iris (Selected Models)
Allows depth of field optimization and image tuning.

Ideal Applications

  • Precision Metrology
  • Semiconductor Inspection
  • Electronics Manufacturing
  • PCB Inspection
  • Automated Optical Inspection (AOI)
  • Dimensional Measurement Systems
  • Industrial Quality Control
  • High-Accuracy Machine Vision Systems
  • Reflective Surface Inspection (Coaxial Models)

Specifications

2/3" C-Mount Telecentric Lens

Model Variable Iris Coaxial Mag WD (mm) F/# MTF30 (lp/mm)
BTLM-0.5X-65-23 No No 0.5X 65±1 5.0 >160
BTLM-0.5X-65D-23 No Yes 0.5X 65±1 5.0 >160
BTLM-0.4X-85-23 No No 0.4X 85±2 4.5 >205
BTLM-0.4X-85D-23 No Yes 0.4X 85±2 4.5 >205
BTLM-0.166X-173-23 (IA) Yes No 0.166X 173±3 3.3 >260

Warm tips:The above DOF is just theoretical value at the ideal aperture (eg. ±763@F11). Actual DOF or the DOF what you need, please check with our sales engineer before order cfm.

Telecentric Lenses Download

Q1: What is the BTLM 2/3" Series used for?
A: The BTLM 2/3" bi-telecentric lens series is designed for high-precision machine vision, metrology, AOI, and semiconductor inspection applications requiring ultra-low distortion imaging.

Q2: What sensor size is this lens compatible with?
A: It is optimized for 2/3" industrial area scan cameras (Φ11mm image circle).

Q3: What is the magnification range of this series?
A: The BTLM 2/3" Series supports magnifications from 0.166X to 0.5X, suitable for both wide-field and precision inspection tasks.

Q4: What is the advantage of a bi-telecentric design?
A: A bi-telecentric lens maintains constant magnification and zero perspective error, ensuring highly accurate and repeatable measurements.

Q5: How accurate is this lens in terms of distortion?
A: The series achieves ultra-low distortion (<0.03%–<0.1%), making it ideal for precision metrology applications.

Q6: What is the difference between standard and “D” models?
A: “D” models include coaxial illumination compatibility, making them suitable for reflective or low-contrast surfaces.

Q7: What working distances are available?
A: Depending on the model, working distances range from 65 mm to 173 mm.

Q8: What industries commonly use this lens?
A: It is widely used in semiconductor inspection, electronics manufacturing, PCB inspection, AOI systems, and industrial automation.

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