1'' 표준 고정 C-마운트 SWIR 렌즈

Q1: What is the TLVS-H1.1 series used for?
A: The TLVS-H1.1 is a Visible–SWIR telecentric lens series designed for semiconductor inspection, IC imaging, silicon transmission analysis, and multi-spectral machine vision applications.

Q2: What is focus shift correction in this lens?
A: Focus shift correction allows the lens to maintain consistent focus across 400–1200nm wavelengths, eliminating the need to refocus when switching between visible and SWIR imaging.

Q3: Can this lens capture internal structures through silicon?
A: Yes. At around 1100nm transmission wavelength, the lens can image internal IC circuits and structures through silicon wafers.

Q4: What magnification options are available?
A: The series supports 0.7X, 1.0X, 2.0X, and 4.0X magnifications, suitable for different inspection and measurement requirements.

Q5: What is the advantage of a telecentric design?
A: Telecentric optics ensure low distortion, stable magnification, and high measurement accuracy, which is essential for precision inspection.

Q6: Does the lens support both coaxial and non-coaxial setups?
A: Yes, the TLVS-H1.1 series is available in coaxial and non-coaxial versions, depending on the application environment.

Q7: What industries commonly use this lens?
A: It is widely used in semiconductor manufacturing, IC inspection, electronics production, precision metrology, and advanced machine vision systems.

Q8: What is the wavelength range of this lens?
A: The lens operates across a wide 400–1200nm spectral range, covering both visible and SWIR imaging.