Q1: What is the TLVS-H1.1 series used for?
A: The TLVS-H1.1 is a Visible–SWIR telecentric lens series designed for semiconductor inspection, IC imaging, silicon transmission analysis, and multi-spectral machine vision applications.
Q2: What is focus shift correction in this lens?
A: Focus shift correction allows the lens to maintain consistent focus across 400–1200nm wavelengths, eliminating the need to refocus when switching between visible and SWIR imaging.
Q3: Can this lens capture internal structures through silicon?
A: Yes. At around 1100nm transmission wavelength, the lens can image internal IC circuits and structures through silicon wafers.
Q4: What magnification options are available?
A: The series supports 0.7X, 1.0X, 2.0X, and 4.0X magnifications, suitable for different inspection and measurement requirements.
Q5: What is the advantage of a telecentric design?
A: Telecentric optics ensure low distortion, stable magnification, and high measurement accuracy, which is essential for precision inspection.
Q6: Does the lens support both coaxial and non-coaxial setups?
A: Yes, the TLVS-H1.1 series is available in coaxial and non-coaxial versions, depending on the application environment.
Q7: What industries commonly use this lens?
A: It is widely used in semiconductor manufacturing, IC inspection, electronics production, precision metrology, and advanced machine vision systems.
Q8: What is the wavelength range of this lens?
A: The lens operates across a wide 400–1200nm spectral range, covering both visible and SWIR imaging.
Estimated Delivery Time
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Descripción
Descripción del producto
Lente telecentrica Visible–SWIR con corrección de desplazamiento de foco para imagen de precisión
La serie TLVS-H1.1 es una lente telecentrica Visible–SWIR de alto rendimiento diseñada para aplicaciones avanzadas de visión por máquina que requieren imagen en un amplio rango de longitud de onda de 400 a 1200 nm. Su tecnología única de corrección de desplazamiento de foco garantiza un enfoque de imagen constante desde la luz visible hasta el infrarrojo de onda corta (SWIR), eliminando la necesidad de enfocar nuevamente durante la inspección multiespectral.
Esta serie permite a los usuarios capturar imágenes visibles y SWIR transmitidas con alta estabilidad, lo que permite la detección de estructuras internas y defectos que son invisibles bajo la imagen estándar de luz visible. Es particularmente efectiva para la inspección de obleas de silicio y la imagen de circuitos internos de IC en una longitud de onda de transmisión de ~1100 nm.
Disponible en aumentos de 0.7X, 1.0X, 2.0X y 4.0X, la serie TLVS-H1.1 admite tanto configuraciones coaxiales como no coaxiales, proporcionando una integración flexible para diferentes sistemas de inspección industrial.
Características principales
✔ Imagen de banda ancha Visible–SWIR (400–1200 nm)
Admite imagen continua desde la luz visible hasta el espectro SWIR.
✔ Tecnología de corrección de desplazamiento de foco
Mantiene un enfoque nítido en múltiples longitudes de onda sin ajustes.
✔ Diseño óptico telecentrico
Garantiza una imagen libre de distorsiones y una alta precisión de medición.
✔ Opciones de multi-aumento (0.7X–4.0X)
Configuraciones flexibles para diversas aplicaciones de visión por máquina.
✔ Imagen de transmisión de silicio de IC (~1100 nm)
Permite la inspección de circuitos internos a través de obleas de silicio.
✔ Versiones coaxiales / no coaxiales disponibles
Adecuado para sistemas de inspección reflectante y transmissiva.
Aplicaciones ideales
- Inspección de obleas de semiconductores
- Imagen de circuitos internos de IC
- Inspección de transmisión de silicio
- Fabricación de electrónica
- Detección de defectos en varios espectros
- Metrología de precisión
- Sistemas avanzados de visión por máquina
- Imagen industrial multiespectral
Especificaciones
Lente telecentrica de montaje C VIS-SWIR 400-1200 nm
| Modelo | Aum. | WD | Círculo de imagen | Coaxial |
|---|---|---|---|---|
| TLVS-0.7XD-H1.1 | 0.7X | 110 mm | Φ20.5 mm | Sí |
| TLVS-0.7X-H1.1 | 0.7X | 110 mm | Φ20.5 mm | No |
| TLVS-1.0XD-H1.1 | 1.0X | 110 mm | Φ24 mm | Sí |
| TLVS-1.0X-H1.1 | 1.0X | 110 mm | Φ24 mm | No |
| TLVS-2.0XD-H1.1 | 2.0X | 110 mm | Φ24 mm | Sí |
| TLVS-2.0X-H1.1 | 2.0X | 110 mm | Φ24 mm | No |
| TLVS-4.0XD-H1.1 | 4.0X | 110 mm | Φ20.5 mm | Sí |
| TLVS-4.0X-H1.1 | 4.0X | 110 mm | Φ20.5 mm | No |
Descarga de lente SWIR
Return and Exchange Policy
Please review our return and exchange policy carefully before placing your order. We encourage all customers to confirm product specifications and application requirements before purchase.
1. Return and Exchange Eligibility
Contrastech accepts return or exchange requests only for product defects or quality issues, subject to review and confirmation.
Returns or exchanges for reasons unrelated to product defects or quality issues are generally not accepted, subject to applicable law.
2. Non-Eligible Return and Exchange Requests
Before placing an order, customers are responsible for confirming that the selected product meets their technical requirements and is suitable for their intended application. Customers are also responsible for evaluating product compatibility with their systems and use cases.
Requests based on the following reasons are generally not eligible:
- Misunderstanding product specifications or selecting the wrong product.
- Product incompatibility with the customer's intended application.
- Personal dissatisfaction unrelated to a confirmed product defect or quality issue.
These limitations are subject to any mandatory rights or remedies available under applicable law.
3. Product Quality and Claim Period
Our products undergo quality control and quality assurance inspections before shipment. However, if a product you receive is damaged, defective, or materially inconsistent with its published description, please contact us within 3 business days of receipt to report the issue.
Important: Please provide your order number, a description of the issue, and relevant photos or videos where available. This information helps our team assess your claim efficiently.
Our team will review the information provided and advise you on the next steps. Please do not return any product before receiving return instructions from our team.
The stated reporting period does not limit any non-waivable rights you may have under applicable law.
4. Refund Processing and Transaction Fees
For return or refund requests that meet our eligibility requirements, we will process the refund within 1 business day after approval.
Please note that a 6.4% transaction processing fee charged by the payment platform is non-refundable and may be deducted from the refund amount, where permitted by applicable law and the relevant payment provider's terms.
The actual time required for the refunded amount to appear in your account may vary depending on your payment provider or bank.
Need Assistance?
If you have questions about our return and exchange policy or need to report a product quality issue, please contact our team.
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