Q1: What is the TLSW SWIR telecentric lens used for?
A: It is designed for SWIR machine vision, semiconductor inspection, material analysis, and precision metrology, especially where defects are not visible in the visible spectrum.
Q2: What wavelength range does this lens support?
A: The lens operates in the 950–1800nm shortwave infrared (SWIR) range, enabling advanced infrared imaging applications.
Q3: Which image sensors is this lens compatible with?
A: It is optimized for Sony IMX990 and 1.1" InGaAs SWIR sensors, commonly used in industrial infrared imaging systems.
Q4: What is the advantage of a telecentric SWIR lens?
A: It provides distortion-free imaging, stable magnification, and high measurement accuracy, which is critical for precision inspection.
Q5: What magnification options are available?
A: The lens is available in 1.0X and 2.0X magnifications, suitable for different inspection and measurement requirements.
Q6: Can the lens adjust depth of field?
A: Yes, selected models feature an adjustable iris design, allowing users to optimize depth of field and image contrast.
Q7: What is the difference between coaxial and non-coaxial versions?
A: The coaxial version is ideal for reflective surfaces like metal or polished wafers, while the non-coaxial version is suitable for general SWIR inspection.
Q8: What industries commonly use this lens?
A: It is widely used in semiconductor manufacturing, electronics inspection, material science, and advanced research imaging systems.
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Descripción
Product Description
High-Performance SWIR Telecentric Lens for Precision Industrial Inspection
The TLSW Series SWIR Telecentric Lenses are designed for advanced shortwave infrared (SWIR) imaging systems, supporting the 950–1800nm spectral range. Optimized for Sony IMX990 and 1.1" InGaAs sensors, these lenses deliver exceptional performance for detecting defects and material differences that are invisible in the visible spectrum.
With telecentric optical design, the lens ensures accurate, distortion-free imaging for precision measurement and inspection applications. Available in 1.0X and 2.0X magnifications, the lens features an adjustable iris design, allowing users to optimize depth of field and image contrast based on inspection requirements.
The TLSW series is available in both coaxial and non-coaxial configurations, making it adaptable to a wide range of industrial machine vision systems.
Key Features
✔ 950–1800nm SWIR Transmission Range
Optimized for shortwave infrared imaging beyond visible light.
✔ Compatible with Sony IMX990 / 1.1" InGaAs Sensors
Designed for high-sensitivity SWIR machine vision systems.
✔ Telecentric Optical Design
Ensures distortion-free, high-accuracy measurement imaging.
✔ 1.0X / 2.0X Magnification Options
Flexible configurations for different inspection requirements.
✔ Adjustable Iris (Selected Models)
Enables depth of field optimization and image contrast control.
✔ Coaxial / Non-Coaxial Versions Available
Supports reflective and non-reflective surface inspection.
Ideal Applications
- Semiconductor Wafer Inspection
- Silicon Material Analysis
- Electronic Component Inspection
- Defect Detection Beyond Visible Spectrum
- Precision Metrology
- Advanced SWIR Imaging Systems
- Research & Scientific Imaging
- Industrial Automation Inspection
Specifications
| Model |
Coaxial
|
Mag.
|
WD
(mm)
|
F/#
|
Object
side NA
|
DOF
(mm)
|
|---|---|---|---|---|---|---|
|
TLSW-0.5XD-H1.1
|
Yes
|
0.5
|
116.4
|
6.3
|
0.040
|
2.02
|
|
TLSW-0.7XD-H1.1
|
Yes
|
0.7
|
116.0
|
6.4
|
0.055
|
1.05
|
|
TLSW-1.0XD-H1.1
|
Yes
|
1.0
|
110.0
|
7.0
|
0.071
|
0.56
|
|
TLSW-1.0X-H1.1
|
No
|
1.0
|
110.0
|
7.0
|
0.071
|
0.56
|
|
TLSW-2.0XD-H1.1
|
Yes
|
2.0
|
110.2
|
11.5
|
0.087
|
0.23
|
|
TLSW-2.0X-H1.1
|
No
|
2.0
|
110.2
|
11.5
|
0.087
|
0.23
|
|
TLSW-4.0XD-H1.1
|
Yes
|
4.0
|
110.3
|
20.0
|
0.100
|
0.10
|
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