Q1: What is the TLVS-H1.1 series used for?
A: The TLVS-H1.1 is a Visible–SWIR telecentric lens series designed for semiconductor inspection, IC imaging, silicon transmission analysis, and multi-spectral machine vision applications.
Q2: What is focus shift correction in this lens?
A: Focus shift correction allows the lens to maintain consistent focus across 400–1200nm wavelengths, eliminating the need to refocus when switching between visible and SWIR imaging.
Q3: Can this lens capture internal structures through silicon?
A: Yes. At around 1100nm transmission wavelength, the lens can image internal IC circuits and structures through silicon wafers.
Q4: What magnification options are available?
A: The series supports 0.7X, 1.0X, 2.0X, and 4.0X magnifications, suitable for different inspection and measurement requirements.
Q5: What is the advantage of a telecentric design?
A: Telecentric optics ensure low distortion, stable magnification, and high measurement accuracy, which is essential for precision inspection.
Q6: Does the lens support both coaxial and non-coaxial setups?
A: Yes, the TLVS-H1.1 series is available in coaxial and non-coaxial versions, depending on the application environment.
Q7: What industries commonly use this lens?
A: It is widely used in semiconductor manufacturing, IC inspection, electronics production, precision metrology, and advanced machine vision systems.
Q8: What is the wavelength range of this lens?
A: The lens operates across a wide 400–1200nm spectral range, covering both visible and SWIR imaging.
Estimated Delivery Time
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Shipping dates are estimates and subject to change. By ordering, you accept possible schedule adjustments. For urgent orders, please confirm with us before purchasing. Post-order cancellations are subject to a 6.4% handling fee.
Beschreibung
Produktbeschreibung
Telezentrische Linse für den Bereich Sichtbar–SWIR mit Fokusverschiebungskorrektur für präzise Bildgebung
Die TLVS-H1.1-Serie ist eine leistungsfähige telezentrische Linse für den Bereich Sichtbar–SWIR, die für anspruchsvolle Machine-Vision-Anwendungen konzipiert ist, bei denen eine Bildgebung über einen breiten Wellenlängenbereich von 400 bis 1200nm erforderlich ist. Ihre einzigartige Technologie zur Korrektur der Fokusverschiebung stellt einen konsistenten Bildfokus vom sichtbaren Licht bis zum kurzwelligen Infrarotbereich (SWIR) sicher und eliminiert die Notwendigkeit einer Nachjustierung bei der Multispektrum-Inspektion.
Diese Serie ermöglicht es Benutzern, sowohl sichtbare als auch durchgelassene SWIR-Bilder mit hoher Stabilität aufzunehmen, wodurch die Erkennung von internen Strukturen und Defekten möglich wird, die bei der Standardbildgebung mit sichtbarem Licht unsichtbar sind. Sie ist besonders wirksam für die Inspektion von Siliziumwafern und die Bildgebung von IC-Internaufbauten bei einer Durchlasswellenlänge von ~1100nm.
Verfügbar in den Vergrößerungen 0,7X, 1,0X, 2,0X und 4,0X, unterstützt die TLVS-H1.1-Serie sowohl koaxiale als auch nicht-koaxiale Konfigurationen und bietet eine flexible Integration in verschiedene industrielle Inspektionssysteme.
Hauptmerkmale
✔ Sichtbar–SWIR Breitband-Bildgebung (400–1200nm)
Unterstützt nahtlose Bildgebung vom sichtbaren Licht bis zum SWIR-Spektrum.
✔ Technologie zur Korrektur der Fokusverschiebung
Erhält einen scharfen Fokus über mehrere Wellenlängen hinweg ohne Justierung.
✔ Telezentrisches optisches Design
Stellt eine verzerrungsfreie Bildgebung und eine hohe Messgenauigkeit sicher.
✔ Optionen mit mehreren Vergrößerungen (0,7X–4,0X)
Flexible Konfigurationen für verschiedene Machine-Vision-Anwendungen.
✔ IC-Silizium-Durchlassbildgebung (~1100nm)
Ermöglicht die Inspektion von internen Schaltungen durch Siliziumwafer.
✔ Koaxiale / Nicht-koaxiale Versionen verfügbar
Geeignet für reflektierende und transmittierende Inspektionssysteme.
Ideale Anwendungen
- Inspektion von Halbleiterwafern
- Bildgebung von IC-Internaufbauten
- Inspektion von Siliziumdurchlass
- Elektronikfertigung
- Defekterkennung über verschiedene Spektren hinweg
- Präzisionsmesstechnik
- Fortgeschrittene Machine-Vision-Systeme
- Multispektrale industrielle Bildgebung
Spezifikationen
400-1200nm VIS-SWIR C-Mount Telezentrische Linse
| Modell | Vergr. | WD | Bildkreis | Koaxial |
|---|---|---|---|---|
| TLVS-0.7XD-H1.1 | 0.7X | 110 mm | Φ20.5 mm | Ja |
| TLVS-0.7X-H1.1 | 0.7X | 110 mm | Φ20.5 mm | Nein |
| TLVS-1.0XD-H1.1 | 1.0X | 110 mm | Φ24 mm | Ja |
| TLVS-1.0X-H1.1 | 1.0X | 110 mm | Φ24 mm | Nein |
| TLVS-2.0XD-H1.1 | 2.0X | 110 mm | Φ24 mm | Ja |
| TLVS-2.0X-H1.1 | 2.0X | 110 mm | Φ24 mm | Nein |
| TLVS-4.0XD-H1.1 | 4.0X | 110 mm | Φ20.5 mm | Ja |
| TLVS-4.0X-H1.1 | 4.0X | 110 mm | Φ20.5 mm | Nein |
SWIR-Linse herunterladen
Return and Exchange Policy
Please review our return and exchange policy carefully before placing your order. We encourage all customers to confirm product specifications and application requirements before purchase.
1. Return and Exchange Eligibility
Contrastech accepts return or exchange requests only for product defects or quality issues, subject to review and confirmation.
Returns or exchanges for reasons unrelated to product defects or quality issues are generally not accepted, subject to applicable law.
2. Non-Eligible Return and Exchange Requests
Before placing an order, customers are responsible for confirming that the selected product meets their technical requirements and is suitable for their intended application. Customers are also responsible for evaluating product compatibility with their systems and use cases.
Requests based on the following reasons are generally not eligible:
- Misunderstanding product specifications or selecting the wrong product.
- Product incompatibility with the customer's intended application.
- Personal dissatisfaction unrelated to a confirmed product defect or quality issue.
These limitations are subject to any mandatory rights or remedies available under applicable law.
3. Product Quality and Claim Period
Our products undergo quality control and quality assurance inspections before shipment. However, if a product you receive is damaged, defective, or materially inconsistent with its published description, please contact us within 3 business days of receipt to report the issue.
Important: Please provide your order number, a description of the issue, and relevant photos or videos where available. This information helps our team assess your claim efficiently.
Our team will review the information provided and advise you on the next steps. Please do not return any product before receiving return instructions from our team.
The stated reporting period does not limit any non-waivable rights you may have under applicable law.
4. Refund Processing and Transaction Fees
For return or refund requests that meet our eligibility requirements, we will process the refund within 1 business day after approval.
Please note that a 6.4% transaction processing fee charged by the payment platform is non-refundable and may be deducted from the refund amount, where permitted by applicable law and the relevant payment provider's terms.
The actual time required for the refunded amount to appear in your account may vary depending on your payment provider or bank.
Need Assistance?
If you have questions about our return and exchange policy or need to report a product quality issue, please contact our team.
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