4/3'' C-MOUNT FIXED LENSE for 420-1100nm | LEMxxCD-H2

Product Description

The 4/3" 10MP C-mount fixed lens is designed for high-resolution industrial and scientific imaging applications, supporting area scan cameras with sensor sizes up to 4/3". Optimized for a wide 420–700nm spectral range, the lens delivers outstanding performance across visible and near-infrared (NIR) imaging environments, ensuring sharp, high-contrast, and distortion-free image quality.

Available in multiple focal length options — 8mm, 12mm, 16mm, 25mm, 35mm, 50mm, and 85mm — this versatile lens provides flexible field-of-view configurations for various working distances and inspection requirements. With professional MTF optimization and a robust mechanical design, the lens ensures stable and precise imaging performance in demanding industrial environments.

Featuring lockable focus and iris screws, the lens maintains consistent settings even under vibration or shock, making it ideal for machine vision inspection, measurement systems, and scientific analysis applications. Its high cost-performance ratio makes it a reliable solution for precision imaging tasks.

Main Features

• 10MP High Resolution Performance
  Delivers excellent image clarity across the entire working distance range.
• Optimized for 4/3" Sensors
  Designed for large-format cameras with uniform brightness and edge-to-edge sharpness.
• 420–700nm Spectral Optimization
  Supports visible and near-infrared (NIR) imaging applications.
• Multiple Focal Length Options
  Available in 8mm / 12mm / 16mm / 25mm / 35mm / 50mm / 85mm.
• Professional MTF Optimization
  Ensures superior contrast, resolution, and imaging accuracy.
• Lockable Focus and Iris Design
  Prevents parameter shift caused by vibration or mechanical shock.
• Robust Industrial Construction
  Suitable for demanding machine vision environments.
• High Cost-Performance Ratio
  Reliable imaging performance with strong value.

Typical Applications

• Machine vision inspection
• Industrial automation systems
• Precision measurement and metrology
• Scientific imaging and analysis
• Electronics and PCB inspection
• Visible and NIR imaging applications