Q1: What is the TLVS-H1.1 series used for?
A: The TLVS-H1.1 is a Visible–SWIR telecentric lens series designed for semiconductor inspection, IC imaging, silicon transmission analysis, and multi-spectral machine vision applications.
Q2: What is focus shift correction in this lens?
A: Focus shift correction allows the lens to maintain consistent focus across 400–1200nm wavelengths, eliminating the need to refocus when switching between visible and SWIR imaging.
Q3: Can this lens capture internal structures through silicon?
A: Yes. At around 1100nm transmission wavelength, the lens can image internal IC circuits and structures through silicon wafers.
Q4: What magnification options are available?
A: The series supports 0.7X, 1.0X, 2.0X, and 4.0X magnifications, suitable for different inspection and measurement requirements.
Q5: What is the advantage of a telecentric design?
A: Telecentric optics ensure low distortion, stable magnification, and high measurement accuracy, which is essential for precision inspection.
Q6: Does the lens support both coaxial and non-coaxial setups?
A: Yes, the TLVS-H1.1 series is available in coaxial and non-coaxial versions, depending on the application environment.
Q7: What industries commonly use this lens?
A: It is widely used in semiconductor manufacturing, IC inspection, electronics production, precision metrology, and advanced machine vision systems.
Q8: What is the wavelength range of this lens?
A: The lens operates across a wide 400–1200nm spectral range, covering both visible and SWIR imaging.
Estimated Delivery Time
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Description
Descrição do Produto
Lente Telecêntrica Visível–SWIR com Correção de Deslocamento de Foco para Imagem de Precisão
A Série TLVS-H1.1 é uma lente telecêntrica Visível–SWIR de alto desempenho, concebida para aplicações avançadas de visão máquina que exigem imagem ao longo de uma ampla faixa de comprimentos de onda, de 400 a 1200nm. A sua tecnologia única de correção de deslocamento de foco garante um foco de imagem consistente, desde a luz visível até ao infravermelho de curta onda (SWIR), eliminando a necessidade de refocalização durante a inspeção multiespectral.
Esta série permite aos utilizadores captar imagens visíveis e SWIR transmitidas com alta estabilidade, permitindo a deteção de estruturas internas e defeitos que são invisíveis sob a imagem padrão de luz visível. É particularmente eficaz para a inspeção de wafers de silício e a imagem de circuitos internos de ICs no comprimento de onda de transmissão de ~1100nm.
Disponível em ampliações de 0.7X, 1.0X, 2.0X e 4.0X, a série TLVS-H1.1 suporta tanto configurações coaxiais como não coaxiais, proporcionando uma integração flexível para diferentes sistemas de inspeção industrial.
Principais Características
✔ Imagem de Banda Larga Visível–SWIR (400–1200nm)
Suporta imagem contínua desde a luz visível até ao espetro SWIR.
✔ Tecnologia de Correção de Deslocamento de Foco
Mantém o foco nítido através de múltiplos comprimentos de onda sem ajuste.
✔ Design Óptico Telecêntrico
Garante imagem sem distorção e alta precisão de medição.
✔ Opções de Multi-Ampliação (0.7X–4.0X)
Configurações flexíveis para diversas aplicações de visão máquina.
✔ Imagem de Transmissão de Silício de IC (~1100nm)
Permite a inspeção de circuitos internos através de wafers de silício.
✔ Versões Coaxiais / Não Coaxiais Disponíveis
Apropriado para sistemas de inspeção reflexiva e transmissiva.
Aplicações Ideais
- Inspeção de Wafers de Semicondutores
- Imagem de Circuitos Internos de IC
- Inspeção de Transmissão de Silício
- Fabricação de Eletrónica
- Deteção de Defeitos Através de Espetros
- Metrologia de Precisão
- Sistemas Avançados de Visão Máquina
- Imagem Industrial Multiespectral
Especificações
Lente Telecêntrica VIS-SWIR 400-1200nm Montagem C
| Modelo | Ampl. | WD | Círculo de Imagem | Coaxial |
|---|---|---|---|---|
| TLVS-0.7XD-H1.1 | 0.7X | 110 mm | Φ20.5 mm | Sim |
| TLVS-0.7X-H1.1 | 0.7X | 110 mm | Φ20.5 mm | Não |
| TLVS-1.0XD-H1.1 | 1.0X | 110 mm | Φ24 mm | Sim |
| TLVS-1.0X-H1.1 | 1.0X | 110 mm | Φ24 mm | Não |
| TLVS-2.0XD-H1.1 | 2.0X | 110 mm | Φ24 mm | Sim |
| TLVS-2.0X-H1.1 | 2.0X | 110 mm | Φ24 mm | Não |
| TLVS-4.0XD-H1.1 | 4.0X | 110 mm | Φ20.5 mm | Sim |
| TLVS-4.0X-H1.1 | 4.0X | 110 mm | Φ20.5 mm | Não |
Download da Lente SWIR
Return and Exchange Policy
Please review our return and exchange policy carefully before placing your order. We encourage all customers to confirm product specifications and application requirements before purchase.
1. Return and Exchange Eligibility
Contrastech accepts return or exchange requests only for product defects or quality issues, subject to review and confirmation.
Returns or exchanges for reasons unrelated to product defects or quality issues are generally not accepted, subject to applicable law.
2. Non-Eligible Return and Exchange Requests
Before placing an order, customers are responsible for confirming that the selected product meets their technical requirements and is suitable for their intended application. Customers are also responsible for evaluating product compatibility with their systems and use cases.
Requests based on the following reasons are generally not eligible:
- Misunderstanding product specifications or selecting the wrong product.
- Product incompatibility with the customer's intended application.
- Personal dissatisfaction unrelated to a confirmed product defect or quality issue.
These limitations are subject to any mandatory rights or remedies available under applicable law.
3. Product Quality and Claim Period
Our products undergo quality control and quality assurance inspections before shipment. However, if a product you receive is damaged, defective, or materially inconsistent with its published description, please contact us within 3 business days of receipt to report the issue.
Important: Please provide your order number, a description of the issue, and relevant photos or videos where available. This information helps our team assess your claim efficiently.
Our team will review the information provided and advise you on the next steps. Please do not return any product before receiving return instructions from our team.
The stated reporting period does not limit any non-waivable rights you may have under applicable law.
4. Refund Processing and Transaction Fees
For return or refund requests that meet our eligibility requirements, we will process the refund within 1 business day after approval.
Please note that a 6.4% transaction processing fee charged by the payment platform is non-refundable and may be deducted from the refund amount, where permitted by applicable law and the relevant payment provider's terms.
The actual time required for the refunded amount to appear in your account may vary depending on your payment provider or bank.
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If you have questions about our return and exchange policy or need to report a product quality issue, please contact our team.
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